Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi. Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements. In International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023. pages 68-71, IEEE, 2023. [doi]
Abstract is missing.