Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre. About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. In Alessandro Savino, Michail Maniatakos, Stefano Di Carlo, Dimitris Gizopoulos, editors, 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023, Crete, Greece, July 3-5, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.