A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise - researchr publication authors

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Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 226-231, IEEE, 2014. [doi]

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