Vivek Asthana, M. Jagadesh Kumar, Ayush Kulshrestha, Munish Kumar, Saikat Kumar Banik, Shruti Aggarwal. 0.25pA/Bit Ultra-Low-Leakage 6T Single-Port SRAM on 22nm Bulk Process for IoT Applications. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.