S. P. Athan, David C. Keezer, J. McKinley. High Frequency Wafer Probing and Power Supply Resonance Effects. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 1069-1078, IEEE Computer Society, 1991.
Abstract is missing.