A Software Linearization Technique Using Embedded Applications for Measuring Microwave Dielectric Response of Materials - researchr publication

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R. Athinarayanan, J. N. Dahiya, J. A. Roberts. A Software Linearization Technique Using Embedded Applications for Measuring Microwave Dielectric Response of Materials. In Hamid R. Arabnia, Minyi Guo, Laurence Tianruo Yang, editors, Proceedings of the International Conference on Embedded Systems and Applications, ESA 04 & Proceedings of the International Conference on VLSI, VLSI 04, June 21-24, 2004, Las Vegas, Nevada, USA. pages 284-288, CSREA Press, 2004.

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