Eduard Atkin, Yuri Volkov, Alexander Klyuev, Vitaly Shumihin. Development of the data-driven readout ASIC for microstrip detectors. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 374-375, IEEE, 2010. [doi]
Abstract is missing.