Amir Attarha, Mehrdad Nourani. Test Pattern Generation for Signal Integrity Faults on Long Interconnects. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 336-344, IEEE Computer Society, 2002. [doi]
Abstract is missing.