Pattern-Constrained Test Case Generation - researchr publication authors

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Martin Atzmüller, Joachim Baumeister, Frank Puppe. Pattern-Constrained Test Case Generation. In David Wilson, Geoff Sutcliffe, editors, Proceedings of the Twentieth International Florida Artificial Intelligence Research Society Conference, May 7-9, 2007, Key West, Florida, USA. pages 518-523, AAAI Press, 2007.

This author has not been identified. Look up 'Martin Atzmüller' in GoogleThis author has not been identified. Look up 'Joachim Baumeister' in GoogleThis author has not been identified. Look up 'Frank Puppe' in Google

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