Pattern-Constrained Test Case Generation

Martin Atzmüller, Joachim Baumeister, Frank Puppe. Pattern-Constrained Test Case Generation. In David Wilson, Geoff Sutcliffe, editors, Proceedings of the Twentieth International Florida Artificial Intelligence Research Society Conference, May 7-9, 2007, Key West, Florida, USA. pages 518-523, AAAI Press, 2007.

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