Martin Atzmüller, Joachim Baumeister, Frank Puppe. Pattern-Constrained Test Case Generation. In David Wilson, Geoff Sutcliffe, editors, Proceedings of the Twentieth International Florida Artificial Intelligence Research Society Conference, May 7-9, 2007, Key West, Florida, USA. pages 518-523, AAAI Press, 2007.
@inproceedings{AtzmullerBP07,
title = {Pattern-Constrained Test Case Generation},
author = {Martin Atzmüller and Joachim Baumeister and Frank Puppe},
year = {2007},
tags = {testing},
researchr = {https://researchr.org/publication/AtzmullerBP07},
cites = {0},
citedby = {0},
pages = {518-523},
booktitle = {Proceedings of the Twentieth International Florida Artificial Intelligence Research Society Conference, May 7-9, 2007, Key West, Florida, USA},
editor = {David Wilson and Geoff Sutcliffe},
publisher = {AAAI Press},
isbn = {978-1-57735-319-5},
}