Quality assurance in memory built-in self-test tools - researchr publication authors

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Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada. Quality assurance in memory built-in self-test tools. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 39-44, IEEE, 2014. [doi]

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