Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada. Quality assurance in memory built-in self-test tools. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 39-44, IEEE, 2014. [doi]
@inproceedings{AuPRSTZ14,
title = {Quality assurance in memory built-in self-test tools},
author = {Albert Au and Artur Pogiel and Janusz Rajski and Piotr Sydow and Jerzy Tyszer and Justyna Zawada},
year = {2014},
doi = {10.1109/DDECS.2014.6868760},
url = {http://dx.doi.org/10.1109/DDECS.2014.6868760},
researchr = {https://researchr.org/publication/AuPRSTZ14},
cites = {0},
citedby = {0},
pages = {39-44},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4560-3},
}