Thomas Au, Marek Syrzycki. Investigation of STI diodes as electrostatic discharge (ESD) protection devices in deep submicron (DSM) CMOS process. In 26th IEEE Canadian Conference on Electrical and Computer Engineering CCECE 2013, Regina, SK, Canada, May 5-8, 2013. pages 1-5, IEEE, 2013. [doi]
@inproceedings{AuS13,
title = {Investigation of STI diodes as electrostatic discharge (ESD) protection devices in deep submicron (DSM) CMOS process},
author = {Thomas Au and Marek Syrzycki},
year = {2013},
doi = {10.1109/CCECE.2013.6567790},
url = {http://dx.doi.org/10.1109/CCECE.2013.6567790},
researchr = {https://researchr.org/publication/AuS13},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {26th IEEE Canadian Conference on Electrical and Computer Engineering CCECE 2013, Regina, SK, Canada, May 5-8, 2013},
publisher = {IEEE},
isbn = {978-1-4799-0031-2},
}