3D Analysis of Scattering Effects based on Ray Tracing Techniques

Stefan Auer, Xiaoxiang Zhu, Stefan Hinz, Richard Bamler. 3D Analysis of Scattering Effects based on Ray Tracing Techniques. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2009, July 12-17, 2009, University of Cape Town, Cape Town, South Africa, Proceedings. pages 17-20, IEEE, 2009. [doi]

Authors

Stefan Auer

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Xiaoxiang Zhu

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Stefan Hinz

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Richard Bamler

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