Stefan Auer, Xiaoxiang Zhu, Stefan Hinz, Richard Bamler. 3D Analysis of Scattering Effects based on Ray Tracing Techniques. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2009, July 12-17, 2009, University of Cape Town, Cape Town, South Africa, Proceedings. pages 17-20, IEEE, 2009. [doi]
@inproceedings{AuerZHB09,
title = {3D Analysis of Scattering Effects based on Ray Tracing Techniques},
author = {Stefan Auer and Xiaoxiang Zhu and Stefan Hinz and Richard Bamler},
year = {2009},
doi = {10.1109/IGARSS.2009.5418256},
url = {http://dx.doi.org/10.1109/IGARSS.2009.5418256},
tags = {rule-based, analysis},
researchr = {https://researchr.org/publication/AuerZHB09},
cites = {0},
citedby = {0},
pages = {17-20},
booktitle = {IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2009, July 12-17, 2009, University of Cape Town, Cape Town, South Africa, Proceedings},
publisher = {IEEE},
}