Myat Thu Linn Aung, Tony T. Kim. Self-contained built-in-self-test/repair transceivers for interconnects in 3DICs. In 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, Jeju, South Korea, October 25-28, 2016. pages 640-641, IEEE, 2016. [doi]
Abstract is missing.