Tom Austin, Charisma Canlas, Brady Morgan, Jorge Luis Rodriguez. Across the Great Divide: Examination of Simulation Data with Actual Silicon Waveforms Improves Device Characterization and Production Test Development. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 270-279, IEEE Computer Society, 2002. [doi]
Abstract is missing.