Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs - researchr publication authors

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Satya Venkata Sandeep Avvaru, Keshab K. Parhi. Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs. In 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, FL, USA, July 15-17, 2019. pages 366-371, IEEE, 2019. [doi]

This author has not been identified. Look up 'Satya Venkata Sandeep Avvaru' in GoogleThis author has not been identified. Look up 'Keshab K. Parhi' in Google

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