Satya Venkata Sandeep Avvaru, Keshab K. Parhi. Effect of Loop Positions on Reliability and Attack Resistance of Feed-Forward PUFs. In 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, FL, USA, July 15-17, 2019. pages 366-371, IEEE, 2019. [doi]
Abstract is missing.