Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato. Variability in device degradations: Statistical observation of NBTI for 3996 transistors. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 218-221, IEEE, 2014. [doi]
Abstract is missing.