External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell

Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato. ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 549-554, ACM, 2015. [doi]

Authors

Hiromitsu Awano

This author has not been identified. Look up 'Hiromitsu Awano' in Google

Masayuki Hiromoto

This author has not been identified. Look up 'Masayuki Hiromoto' in Google

Takashi Sato

This author has not been identified. Look up 'Takashi Sato' in Google
runs on