Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato. ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 549-554, ACM, 2015. [doi]
Abstract is missing.