Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato. ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 549-554, ACM, 2015. [doi]
@inproceedings{AwanoHS15,
title = {ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell},
author = {Hiromitsu Awano and Masayuki Hiromoto and Takashi Sato},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092448},
researchr = {https://researchr.org/publication/AwanoHS15},
cites = {0},
citedby = {0},
pages = {549-554},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}