Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato. Multi-trap RTN parameter extraction based on Bayesian inference. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 597-602, IEEE, 2013. [doi]
Abstract is missing.