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Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell. Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectronics Journal, 45(3):336-344, 2014. [doi]

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