Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma. Smart selection of indirect parameters for DC-based alternate RF IC testing. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 19-24, IEEE, 2012. [doi]
Abstract is missing.