James H. Aylor, James P. Cohoon, E. L. Feldhousen, Barry W. Johnson. Compacting randomly generated test sets. In Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990. pages 153-156, IEEE, 1990. [doi]
@inproceedings{AylorCFJ90,
title = {Compacting randomly generated test sets},
author = {James H. Aylor and James P. Cohoon and E. L. Feldhousen and Barry W. Johnson},
year = {1990},
doi = {10.1109/ICCD.1990.130188},
url = {https://doi.org/10.1109/ICCD.1990.130188},
researchr = {https://researchr.org/publication/AylorCFJ90},
cites = {0},
citedby = {0},
pages = {153-156},
booktitle = {Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990},
publisher = {IEEE},
isbn = {0-8186-2079-X},
}