James H. Aylor, James P. Cohoon, E. L. Feldhousen, Barry W. Johnson. Compacting randomly generated test sets. In Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990. pages 153-156, IEEE, 1990. [doi]
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