Florence Azaïs, Laurent Larguier, Michel Renovell. Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 239-244, IEEE, 2007. [doi]
@inproceedings{AzaisLR07, title = {Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits}, author = {Florence Azaïs and Laurent Larguier and Michel Renovell}, year = {2007}, doi = {10.1109/ATS.2007.73}, url = {https://doi.org/10.1109/ATS.2007.73}, researchr = {https://researchr.org/publication/AzaisLR07}, cites = {0}, citedby = {0}, pages = {239-244}, booktitle = {16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007}, publisher = {IEEE}, isbn = {978-0-7695-2890-8}, }