J. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay. Impact of resistive-open defects on the heat current of TAS-MRAM architectures. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 532-537, IEEE, 2012. [doi]
@inproceedings{AzevedoVBDGTPAM12-1,
title = {Impact of resistive-open defects on the heat current of TAS-MRAM architectures},
author = {J. Azevedo and Arnaud Virazel and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri-Sanial and G. Prenat and Jérémy Alvarez-Herault and Ken Mackay},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176526},
researchr = {https://researchr.org/publication/AzevedoVBDGTPAM12-1},
cites = {0},
citedby = {0},
pages = {532-537},
booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012},
editor = {Wolfgang Rosenstiel and Lothar Thiele},
publisher = {IEEE},
isbn = {978-1-4577-2145-8},
}