In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops - researchr publication authors

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Sarah Azimi, Corrado De Sio, Luca Sterpone. In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops. In 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020. pages 1-6, IEEE, 2020. [doi]

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