Sarah Azimi, Corrado De Sio, Luca Sterpone. In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops. In 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{AzimiSS20, title = {In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops}, author = {Sarah Azimi and Corrado De Sio and Luca Sterpone}, year = {2020}, doi = {10.1109/IOLTS50870.2020.9159738}, url = {https://doi.org/10.1109/IOLTS50870.2020.9159738}, researchr = {https://researchr.org/publication/AzimiSS20}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020}, publisher = {IEEE}, isbn = {978-1-7281-8187-5}, }