A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor - researchr publication authors

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Sarah Azimi, Corrado De Sio, Luca Sterpone. A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 252-257, IEEE, 2021. [doi]

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