Sarah Azimi, Corrado De Sio, Luca Sterpone. A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 252-257, IEEE, 2021. [doi]
@inproceedings{AzimiSS21,
title = {A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor},
author = {Sarah Azimi and Corrado De Sio and Luca Sterpone},
year = {2021},
doi = {10.23919/DATE51398.2021.9473944},
url = {https://doi.org/10.23919/DATE51398.2021.9473944},
researchr = {https://researchr.org/publication/AzimiSS21},
cites = {0},
citedby = {0},
pages = {252-257},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021},
publisher = {IEEE},
isbn = {978-3-9819263-5-4},
}