Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits

S. M. Aziz, Joarder Kamruzzaman. Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 119, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.