Naoya Azuma, T. Makita, S. Ueyama, Makoto Nagata, S. Takahashi, M. Murakami, K. Hori, S. Tanaka, M. Yamaguchi. In-system diagnosis of RF ICs for tolerance against on-chip in-band interferers. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-9, IEEE Computer Society, 2013. [doi]
Abstract is missing.