Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, J.-F. Côté, Givargis Danialy, Martin Keim, Lori Schramm. IJTAG Through a Two-Pin Chip Interface. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.