F. Baccar, Stephane Azzopardi, L. Theolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard. Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. Microelectronics Reliability, 53(9-11):1719-1724, 2013. [doi]
@article{BaccarATBDW13,
title = {Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach},
author = {F. Baccar and Stephane Azzopardi and L. Theolier and K. El Boubkari and Jean-Yves Delétage and Eric Woirgard},
year = {2013},
doi = {10.1016/j.microrel.2013.07.076},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.076},
researchr = {https://researchr.org/publication/BaccarATBDW13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1719-1724},
}