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Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach

F. Baccar, Stephane Azzopardi, L. Theolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard. Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. Microelectronics Reliability, 53(9-11):1719-1724, 2013. [doi]

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