Christian Bachmann, Andreas Genser, Christian Steger, Reinhold Weiss, Josef Haid. Automated Power Characterization for Run-Time Power Emulation of SoC Designs. In Sebastián López, editor, 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2010, 1-3 September 2010, Lille, France. pages 587-594, IEEE, 2010. [doi]
Abstract is missing.