Ulrich Backhausen, Oscar Bailan, Paolo Bemardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner. Robustness in automotive electronics: An industrial overview of major concerns. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 157-162, IEEE, 2017. [doi]
@inproceedings{BackhausenBBLHK17,
title = {Robustness in automotive electronics: An industrial overview of major concerns},
author = {Ulrich Backhausen and Oscar Bailan and Paolo Bemardi and Sergio de Luca and Julie Henzler and Thomas Kern and Davide Piumatti and Thomas Rabenalt and Krishnapriya Chakiat Ramamoorthy and Ernesto Sánchez and Alessandro Sansonetti and Rudolf Ullmann and Federico Venini and Robert Wiesner},
year = {2017},
doi = {10.1109/IOLTS.2017.8046234},
url = {https://doi.org/10.1109/IOLTS.2017.8046234},
researchr = {https://researchr.org/publication/BackhausenBBLHK17},
cites = {0},
citedby = {0},
pages = {157-162},
booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0352-9},
}