Ulrich Backhausen, Oscar Bailan, Paolo Bemardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner. Robustness in automotive electronics: An industrial overview of major concerns. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 157-162, IEEE, 2017. [doi]
No references recorded for this publication.
No citations of this publication recorded.