Bayesian degradation modeling for reliability prediction of organic light-emitting diodes

Suk Joo Bae, Tao Yuan, Seong Joon Kim. Bayesian degradation modeling for reliability prediction of organic light-emitting diodes. J. Comput. Science, 17:117-125, 2016. [doi]

Authors

Suk Joo Bae

This author has not been identified. Look up 'Suk Joo Bae' in Google

Tao Yuan

This author has not been identified. Look up 'Tao Yuan' in Google

Seong Joon Kim

This author has not been identified. Look up 'Seong Joon Kim' in Google