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Suk Joo Bae, Tao Yuan, Seong Joon Kim. Bayesian degradation modeling for reliability prediction of organic light-emitting diodes. J. Comput. Science, 17:117-125, 2016. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation TestsJong In Park, Suk Joo Bae. tr, 59(1):74-90, 2010. [doi] Bivariate Lifetime Model for Organic Light-Emitting DiodesDae Whan Kim, Hyunseok Oh, Byeng Dong Youn, Dongil Kwon. tie, 64(3):2325-2334, 2017. [doi]
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