Suk Joo Bae, Tao Yuan, Seong Joon Kim. Bayesian degradation modeling for reliability prediction of organic light-emitting diodes. J. Comput. Science, 17:117-125, 2016. [doi]
@article{BaeYK16,
title = {Bayesian degradation modeling for reliability prediction of organic light-emitting diodes},
author = {Suk Joo Bae and Tao Yuan and Seong Joon Kim},
year = {2016},
doi = {10.1016/j.jocs.2016.08.006},
url = {http://dx.doi.org/10.1016/j.jocs.2016.08.006},
researchr = {https://researchr.org/publication/BaeYK16},
cites = {0},
citedby = {0},
journal = {J. Comput. Science},
volume = {17},
pages = {117-125},
}