M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone. Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 146-151, IEEE Computer Society, 2007. [doi]
Abstract is missing.