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Temperature dependence of neutron-induced soft errors in SRAMs

M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost. Temperature dependence of neutron-induced soft errors in SRAMs. Microelectronics Reliability, 52(1):289-293, 2012. [doi]

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M. Bagatin

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Simone Gerardin

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Alessandro Paccagnella

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C. Andreani

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G. Gorini

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C. D. Frost

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