Temperature dependence of neutron-induced soft errors in SRAMs

M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost. Temperature dependence of neutron-induced soft errors in SRAMs. Microelectronics Reliability, 52(1):289-293, 2012. [doi]

Abstract

Abstract is missing.