M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost. Temperature dependence of neutron-induced soft errors in SRAMs. Microelectronics Reliability, 52(1):289-293, 2012. [doi]
@article{BagatinGPAGF12,
title = {Temperature dependence of neutron-induced soft errors in SRAMs},
author = {M. Bagatin and Simone Gerardin and Alessandro Paccagnella and C. Andreani and G. Gorini and C. D. Frost},
year = {2012},
doi = {10.1016/j.microrel.2011.08.011},
url = {http://dx.doi.org/10.1016/j.microrel.2011.08.011},
researchr = {https://researchr.org/publication/BagatinGPAGF12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {1},
pages = {289-293},
}